Friday, 22 November 2013
MAGCIS - Monatomic and Gas Cluster Ion Source
The Thermo Scientific™ MAGCIS™ dual mode ion source enables depth profiling analysis and surface cleaning of both soft and hard materials on the same XPS instrument. Switching between gas cluster sputtering and monatomic sputtering is handling completely by the Avantage data system, and can be done in a matter of seconds.
Subscribe to:
Post Comments (Atom)
No comments:
Post a Comment