Chemical thermodynamic (non) epitaxy

Using the word "revolutionary" in the context of semiconductor materials is both interesting and dangerous. According to University of Maryland researchers (www.newsdesk.umd.edu/scitech/release.cfm?ArticleID=2106 and published in the journal Science 26 March 2010:Vol. 327. no. 5973, pp. 1634 - 1638) a completely new way to produce high quality semiconductor materials, "critical" for advanced microelectronics and nanotechnology, has been devised. The team has created a process that uses chemical thermodynamics to produce, in solution, a broad range of different combination materials, each with a shell of structurally perfect mono-crystal semiconductor around a metal core. Early days, but an HBT in a test tube?

Diamond growth

The UK government and the Wellcome Trust have announced further funding to support Diamond Light Source, the UK’s national synchrotron science facility, in the next phase of its development. Approximately £110 million has been committed for phase III of its development, 14 per cent from the Wellcome Trust and 86 per cent through the Science and Technology Facilities Council (STFC). (www.wellcome.ac.uk/News/Media-office/Press-releases/2010/WTX059047.htm)

Z contrast sees small

Using Z -contrast (atomic number) scanning transmission electron microscopy (www.ornl.gov/info/press_releases/get_press_release.cfm?ReleaseNumber=mr20100325-00) researchers at the Oak Ridge National Laboratory have obtained the first images that distinguish individual light atoms such as boron, carbon, nitrogen and oxygen. An international team analysed boron nitride samples prepared by Oxford University researchers, using STEM energies (60KeV) low enough to avoid displacement damage in low atomic number elements. The microscope manufacturer (Nion Company, www.nion.com) has clearly picked up with cold field emission STEM where the former VG Microscopes left off.

Critical dimensions

With ever shrinking dimensions within ICs, the role of metrology in maintaining high yield is critical. Researchers are challenged to get accurate measurements of sub-40nm dense trenches and contact holes coming from 193-immersion lithography or e-beam lithography. CEA-Leti's (www.leti.fr) Hybrid Metrology Project has shown noteworthy results in reducing measurement uncertainty at sub-28nm nodes using an alternative 3D-AFM (atomic force microscope) mode for critical measurements (nanotechwire.com/news.asp?nid=9645). The team aims to help equipment makers develop a critical dimension metrology production tool dedicated to hybrid metrology that will reduce R&D cycle time and improve production yield for manufacturers.

Self-driving cars

My colleague John Grange was interested to follow a New Scientist tweet (bit.ly/bDay5A) to an article about Volvo's new technology initiative to move further down the road of self-driving cars. Whilst recognising the potential benefits of the new technologies following adaptive cruise control and semi-autonomous parking systems he wonders where this might all lead. I have a different perspective, partly reflecting my extensive utilization of public transport for the last 21 months, partly my new found enjoyment of cycling ... and also the fact that I never driven a Volvo!

Thought for the day

"A common mistake that people make when trying to design something completely foolproof is to underestimate the ingenuity of complete fools." Douglas Adams, Author (1952 - 2001).