“It is easier to criticise than to correct our past errors.” Titus Livius, Historian (c64 BC- c12 AD)
Monday, 14 March 2016
To provide quantitative, repeatable MOCVD carrier characterization, k-Space Associates Inc. have developed the kSA Emissometer. This ex situ tool scans the entire carrier and measures the diffuse reflectance, specular reflectance and emissivity at each point, providing a visual and quantitative map of the entire carrier. To better understand the power of the kSA Emissometer and the correlation between ex situ carrier emissivity and in situ carrier temperature click here.