Thought for the month

“In the choice between changing one’s mind and proving there is no need to do so, most people get busy on the proof.” John K. Galbraith, Economist (1908 – 2006).

Monday, 18 April 2016

Breaking wafers

In situ high-speed crack propagation within silicon wafers under thermal stress has been imaged simultaneously in direct transmission and diffraction X-ray imaging.

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