About us

Our company, founded in March 2006, provides tools for analysis, thin film deposition, measurement and control applications from market-leading suppliers. We focus on research, development and process control in the materials science, energy research and semiconductor markets. We have a significant breadth of product offering, including the World market leading thin film metrology company k-Space Associates, Inc. and our 15+ year relationship has included 9 Distributor of the Year awards.

Products and services

k-Space Associates, Inc.

In-situ thin film metrology

European sales partner.

Staib Instruments GmbH

Products for RHEED and surface analysis

UK & Ireland sales partner.

Thought for the month

"There are decades where nothing happens; and there are weeks where decades happen" Vladimir Ilyich Lenin. 1870 – 1924

Contact

RTA Instruments Ltd
Highfield
Back Lane,
Monks Eleigh
IP7 7BA
United Kingdom


E: sales at rta-instruments.com

Monday 19 April 2010

Z contrast sees small

Using Z -contrast (atomic number) scanning transmission electron microscopy (www.ornl.gov/info/press_releases/get_press_release.cfm?ReleaseNumber=mr20100325-00) researchers at the Oak Ridge National Laboratory have obtained the first images that distinguish individual light atoms such as boron, carbon, nitrogen and oxygen. An international team analysed boron nitride samples prepared by Oxford University researchers, using STEM energies (60KeV) low enough to avoid displacement damage in low atomic number elements. The microscope manufacturer (Nion Company, www.nion.com) has clearly picked up with cold field emission STEM where the former VG Microscopes left off.

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